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Evaluation methodology for current collapse phenomenon of GaN HEMTs

Evaluation methodology for current collapse phenomenon of GaN HEMTs

T. Sugiyama et al., "Evaluation methodology for current collapse phenomenon of GaN HEMTs," 2018 IEEE International Reliability Physics Symposium (IRPS), Burlingame, CA, 2018, pp. 3B.4-1-3B.4-5.
doi: 10.1109/IRPS.2018.8353559

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