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The information presented in this cross reference is based on TOSHIBA's selection criteria and should be treated as a suggestion only. Please carefully review the latest versions of all relevant information on the TOSHIBA products, including without limitation data sheets and validate all operating parameters of the TOSHIBA products to ensure that the suggested TOSHIBA products are truly compatible with your design and application.
Please note that this cross reference is based on TOSHIBA's estimate of compatibility with other manufacturers' products, based on other manufacturers' published data, at the time the data was collected.
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Case 4: EMI noise solutions based on the results of simulation


EMI noise problem, documents on the resolution of EMI problems, causes of gate oscillation, maintaining high efficiency, development of a new product

The oscillation of the gate-drive circuit adversely affected EMI noise.
The causes of the EMI noise were identified by systematically analyzing the countermeasures we had learned through experience.
Application notes describing the causes and theory of EMI noise based on simulation results without relying on engineers’ personal experience

Service description

Previously, engineers used to rely on their personal experience to solve EMI noise problems. Instead, Toshiba analyzed simulation results and waveforms to find solutions. Application notes that summarize the analysis results are now available.


  • Describes the mechanism of EMI noise generation
  • Describes the improvements achieved using both simulated and measured data

Problem-Solving Examples

Solution for Company E, a manufacturer of high-capacity power supplies (Employee population: 500)

Company E, a manufacturer of server power supply units, was testing a new product. Its efficiency target was 94%. While the new power supply unit met the efficiency target, its design team was having difficulty reducing EMI noise.

Solving the problem based on the results of EMI noise simulation performed by Toshiba

While groping for a solution, the design team of Company E heard second hand about Toshiba’s application notes on EMI noise. As demonstrated in the application notes, measurements of turn-off waveforms indicate a correlation between the oscillation of a gate drive circuit and the intensity of EMI noise (Figure 1).


Figure 1

Engineers used to rely on their individual experience when changing a gate resistor, placing a drain-source capacitor and modifying the circuit layout. In the past, engineers typically relied on their experience to identify the causes of EMI noise. Now, our application notes provide theoretical explanations for the benefits of each EMI solution.
In addition, the application notes contain the results of simulation showing that gate oscillation is caused by changes in drain current (Ids) as well as changes in voltage due to the source inductance (Ls) (Figure 2).


Figure 2 Mechanism of Gate Oscillation upon Turn-Off

Toshiba advised the design team of Company E to add a capacitor between gate and source in order to prevent gate oscillation. Consequently, the design team developed a new product with reduced EMI noise while maintaining high efficiency.

List of Problem-Solving Examples


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