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Semiconductor Device Reliability

This page describes reliability information of semiconductor products.

[As of April, 2016]

Semiconductor Device Reliability

Describes the basic concept of semiconductor device reliability and what affects it.

Failure Mechanisms

Describes various circuit faults that can occur in semiconductor devices, and their mechanisms from both device and assembly perspectives.

Reliability Testing

Discusses reliability testing, which is essential to assure high reliability.

Failure Rate Estimation Methods

Describes part stress analysis prediction, a technique used to predict possible failure rates of semiconductor devices.

Failure Analysis

Describes equipment and procedures for failure analysis and introduces an example of a commonly used technique

This page describes reliability information of semiconductor products.

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·Before creating and producing designs and using, customers must also refer to and comply with the latest versions of all relevant TOSHIBA information and the instructions for the application that Product will be used with or for.