3글자 이상 입력하세요.
About information presented in this cross reference
The information presented in this cross reference is based on TOSHIBA's selection criteria and should be treated as a suggestion only. Please carefully review the latest versions of all relevant information on the TOSHIBA products, including without limitation data sheets and validate all operating parameters of the TOSHIBA products to ensure that the suggested TOSHIBA products are truly compatible with your design and application.
Please note that this cross reference is based on TOSHIBA's estimate of compatibility with other manufacturers' products, based on other manufacturers' published data, at the time the data was collected.
TOSHIBA is not responsible for any incorrect or incomplete information. Information is subject to change at any time without notice.
제품종류 선택
Select Application
Find everything you need for your next product design. Simply select an application and click through to the block diagram to discover our semiconductor solutions.
New Products / News
Today’s changing in the social environment, the purpose and applications have been expanded to public safety, disaster prevention, safety, etc., so constantly monitors through Internet connection utilizing image analysis technology have been expanding. With the expansion of Internet and high-speed large-capacity communication and the dramatic development of image processing technology, the transition from analog cameras to IP cameras (network cameras) advances, and storage and transfer in HD recording become possible, and it rapidly expands with low cost. Power management and signal quality are particularly challenging with highly functional surveillance cameras. By using MOSFET and high-performance, high-performance power management ICs that use Toshiba's newest processes, power management is realized to efficiently operate various functions with high-function LSIs. The lineup includes TVS Diodes (ESD Protection Diodes) and eFuse IC for protecting the internal circuitry from power-line failures.