Toshiba releases high-speed photorelay for semiconductor testers

Toshiba Electronics Europe GmbH (“Toshiba”) has released a new low voltage, high-speed photorelay. Particularly suitable for the pin electronics of semiconductor testers, the TLP3450S makes measuring devices-under-test (DUTs) at fast speeds more precise. It is also suited for use in probe cards, measuring instruments and a wide variety of industrial equipment.

The new TLP3450S is based upon an upgraded internal configuration with enhanced infrared LEDs coupled to photodiode arrays that have an optimised design. As a result, the turn-on switching time (t_ON, this represents a 40% improvement, which will significantly benefit the overall throughput of the ATE system.

The TLP3450S has a smaller output capacitance (C_OFF) of just 0.6pF, which reduces high-frequency signal leakage when the output is turned off - this will reduce the noise and improve the accuracy of multiplexing structures. The device also has a lower on-resistance (R_ON

The TLP3450S has an input-output isolation (BVs) rating of 500Vrms and is able to operate in ambient temperatures in the range of -40°C to +110°C. It is configured as a form A contact device and is capable of sourcing 160mA (I_ON) continuously. The pulsed rating is 480mA (I_ONP).

Complex ATE systems require small components to improve the mounting density. To achieve this, the TLP3450S is housed in a tiny S-VSON4T package measuring just 1.45mm × 2.0mm × 1.3mm – an 18% reduction in footprint when compared to conventional products.