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The information presented in this cross reference is based on TOSHIBA's selection criteria and should be treated as a suggestion only. Please carefully review the latest versions of all relevant information on the TOSHIBA products, including without limitation data sheets and validate all operating parameters of the TOSHIBA products to ensure that the suggested TOSHIBA products are truly compatible with your design and application.
Please note that this cross reference is based on TOSHIBA's estimate of compatibility with other manufacturers' products, based on other manufacturers' published data, at the time the data was collected.
TOSHIBA is not responsible for any incorrect or incomplete information. Information is subject to change at any time without notice.
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What is surge current?
Forward surge current is one of the maximum ratings and represents the instantaneous current in the forward direction. It is mainly used for diodes. The non-repeating maximum permissible peak current is the value that allows one cycle of 50 Hz sinusoidal waveform (conduction angle 180 degrees) to flow in the forward direction at the specified junction temperature. It is described as the non-repeating peak forward surge current (IFSM) in the product datasheet. Depending on the product, there are surge characteristic curves that describe the surge current from 1 cycle to 50 cycles.
In Toshiba's SiC (Silicon Carbide) Schottky Barrier Diode (SBD), the structure is optimized. The surge current is higher than that of Si (Silicon) SBD and 7 to 9 times the DC current rating IF (DC)
Absolute Maximum Ratings (Note) (Unless otherwise specified,Ta=25℃）
Note: Continuous use under heavy loads ( e.g,application of high temperature/current/voltage and significant change in temperature etc. ) may cause in the reliability of this product to decrease significantly even if the operating conditions ( i.e,operating temperature/current/voltage etc. ) are within the absolute maximum ratings.
Please design the appropriate reliability upon reviewing the Toshiba Semiconductor Reliability Handbook ( "Handling Precautions" and "Derating Concept and Methods" ) and individual reliability data ( i.e,reliability test report,estimated failure rate,etc. )
Note 1: t=50㎲
Note 2: f=50㎐（ half sine wave t=10ms ）