Note: Continuous use under heavy loads ( e.g,application of high temperature/current/voltage and significant change in temperature etc. ) may cause in the reliability of this product to decrease significantly even if the operating conditions ( i.e,operating temperature/current/voltage etc. ) are within the absolute maximum ratings.
Please design the appropriate reliability upon reviewing the Toshiba Semiconductor Reliability Handbook ( "Handling Precautions" and "Derating Concept and Methods" ) and individual reliability data ( i.e,reliability test report,estimated failure rate,etc. )
Note 1: t=50㎲
Note 2: f=50㎐（ half sine wave t=10ms ）