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About information presented in this cross reference

The information presented in this cross reference is based on TOSHIBA's selection criteria and should be treated as a suggestion only. Please carefully review the latest versions of all relevant information on the TOSHIBA products, including without limitation data sheets and validate all operating parameters of the TOSHIBA products to ensure that the suggested TOSHIBA products are truly compatible with your design and application.
Please note that this cross reference is based on TOSHIBA's estimate of compatibility with other manufacturers' products, based on other manufacturers' published data, at the time the data was collected.
TOSHIBA is not responsible for any incorrect or incomplete information. Information is subject to change at any time without notice.

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Example of measurement of the key bipolar transistor characteristics

Example of IC-VCE measurement

The IC-VCE test requires pulse measurement.

Example of DC current gain (hFE) measurement

The hFE test requires pulse measurement.

Example of measurement of collector-emitter saturation voltage, VCE(sat)

The VCE(sat) test requires pulse measurement.

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