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The information presented in this cross reference is based on TOSHIBA's selection criteria and should be treated as a suggestion only. Please carefully review the latest versions of all relevant information on the TOSHIBA products, including without limitation data sheets and validate all operating parameters of the TOSHIBA products to ensure that the suggested TOSHIBA products are truly compatible with your design and application.
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IEC61000-4-2 and IEC 61000-4-5 are designed to ensure that electronic systems will not be degraded or destroyed by ESD in the everyday environment.
1. IEC 61000-4-2 test (ESD immunity test: Human body model)
As is the case with the HBM, this test simulates a discharge that might be released from a charged human body. Two methods are used for ESD testing:
These ESD tests are stipulated in IEC 61000-4-2 from the International Electrotechnical Commission (IEC).
Toshiba’s ESD protection diodes are tested using both direct and air discharge methods.
2. IEC 61000-4-5 test (Surge immunity test: Lightning surge test)
Also known as a lightning surge test, a surge immunity test models transient phenomena caused by a direct lightning strike as well as voltage and current surges induced by a nearby lightning strike. This test also includes transient switching phenomena such as a sharp load variation and a load short-circuit that might occur when the power switch of a large machine is turned on. The IEC 61000-4-5 test is the most stringent system-level surge immunity test in terms of the level and cycle time of the surge current applied.
The surge immunity test is stipulated in IEC 61000-4-5.