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The information presented in this cross reference is based on TOSHIBA's selection criteria and should be treated as a suggestion only. Please carefully review the latest versions of all relevant information on the TOSHIBA products, including without limitation data sheets and validate all operating parameters of the TOSHIBA products to ensure that the suggested TOSHIBA products are truly compatible with your design and application.
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Common-mode transient immunity refers to the maximum tolerable rate of rise (fall) of input/output common-mode voltage at which the specified High (Low) level can be maintained. A photocoupler has a small capacitance (0.6 to 0.8pF) between the input and output terminals. When an abrupt change in voltage occurs between the input and output terminals, a displacement current that occurs through this capacitance flows into the photodetector chip circuit, eventually causing malfunction. This phenomenon is likely to be felt more clearly in high-speed and high-sensitivity photocouplers. For transistor couplers, since their device responsiveness is about several times to tens of times lower than that of IC couplers, this phenomenon is unlikely to manifest itself easily.