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The information presented in this cross reference is based on TOSHIBA's selection criteria and should be treated as a suggestion only. Please carefully review the latest versions of all relevant information on the TOSHIBA products, including without limitation data sheets and validate all operating parameters of the TOSHIBA products to ensure that the suggested TOSHIBA products are truly compatible with your design and application.
Please note that this cross reference is based on TOSHIBA's estimate of compatibility with other manufacturers' products, based on other manufacturers' published data, at the time the data was collected.
TOSHIBA is not responsible for any incorrect or incomplete information. Information is subject to change at any time without notice.
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Electrostatic discharge (ESD) testing is performed to test the susceptibility of ICs and electronic devices to ESD. ESD tests are broadly divided into device- and system-level tests. These are go/no-go tests that simply determine whether equipment under test (EUT) is destroyed by ESD.
Nowadays, datasheets for ICs and ESD protection devices provide a transmission line pulse (TLP) I-V curve for ESD protection circuitry under short-pulse conditions. The TLP I-V curve helps you evaluate the ESD susceptibility of a system and select the right ESD protection diodes without destroying a DUT.
This type of test is called a TLP test. The datasheets for Toshiba’s new ESD protection diodes also contain TLP I-V curves. See the FAQ entry “What is a TLP test?”
What is a TLP test?
For TVS diode (ESD protection diode) products, please refer to the following links.