Electrostatic discharge (ESD) testing is performed to test the susceptibility of ICs and electronic devices to ESD. ESD tests are broadly divided into device- and system-level tests. These are go/no-go tests that simply determine whether equipment under test (EUT) is destroyed by ESD.
Nowadays, datasheets for ICs and ESD protection devices provide a transmission line pulse (TLP) I-V curve for ESD protection circuitry under short-pulse conditions. The TLP I-V curve helps you evaluate the ESD susceptibility of a system and select the right ESD protection diodes without destroying a DUT.
This type of test is called a TLP test. The datasheets for Toshiba’s new ESD protection diodes also contain TLP I-V curves. See the FAQ entry “What is a TLP test?”
What is a TLP test?
For TVS diode (ESD protection diode) products, please refer to the following links.