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The information presented in this cross reference is based on TOSHIBA's selection criteria and should be treated as a suggestion only. Please carefully review the latest versions of all relevant information on the TOSHIBA products, including without limitation data sheets and validate all operating parameters of the TOSHIBA products to ensure that the suggested TOSHIBA products are truly compatible with your design and application.
Please note that this cross reference is based on TOSHIBA's estimate of compatibility with other manufacturers' products, based on other manufacturers' published data, at the time the data was collected.
TOSHIBA is not responsible for any incorrect or incomplete information. Information is subject to change at any time without notice.
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Gate leakage current (I GSS)
The leakage current that occurs when the specified voltage is applied across gate and source with drain and source short-circuited
IGSSmeasurement
Drain cut-off current (I DSS)
The leakage current that occurs when a voltage is applied across drain and source with gate and source short-circuited
IDSSmeasurement
Drain-source breakdown voltage (V (BR)DSS/V (BR)DXS)
The maximum voltage that the device is guaranteed to block between drain and source
V (BR)DSS: With gate and source short-circuited
V (BR)DSX: With gate and source reverse-biased
V(BR)DSSmeasurement
V(BR)DSXmeasurement
Data sheet description
Characteristics | Symbol | Test Conditions | Min | Typ | Max | Unit |
---|---|---|---|---|---|---|
Gate leakage current | IGSS | VGS = ±20 V, VDS = 0 V | — | — | ±0.1 | µA |
Drain cut-off current | IDSS | VDS = 40 V, VGS = 0 V | — | — | 10 | |
Drain-source breakdown voltage | V(BR)DSS | ID = 10 mA, VGS = 0 V | 40 | — | — | V |
V(BR)DSX | ID = 10 mA, VGS = -20 V | 25 | — | — |